Repository logo Institutional repository
  • Communities & Collections
  • Browse
  • Site
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Hoehl, Arne"

Filter results by typing the first few letters
Now showing 1 - 1 of 1
  • Results Per Page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    Characterization of semiconductor samples using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy

    Hermann, Peter
    ;
    Hoehl, Arne
    ;
    Ulrich, Georg
    ;
    Fleischmann, Claudia  
    ;
    Hermelink, Antje
    Journal article
    2014, Optics Express, (22) 15, p.17948-17958

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings