Browsing by Author "Hoffman, F."
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Publication High resolution 2D scanning spreading resistance microscopy (SSRM) of thin film SOI MOSFETs with ultra short effective channel length
;Hartwich, J. ;Alvarez, David ;Dreeskornfeld, L. ;Hoffman, F. ;Kretz, J. ;Landgraf, E.Luyken, R.J.Proceedings paper2003, IEEE International SOI Conference, 29/09/2003, p.35-36