Browsing by Author "Hopkins, John"
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Publication In-line characterization of heterojunction bipolar transistor base layers by high-resolution X-ray diffraction
Proceedings paper2007, Analytical Techniques for Semiconductor Materials and Process Characterization 5 - ALTECH, 13/09/2007, p.151-160Publication In-line characterization of heterojunction bipolar transistor base layers by high-resolution x-ray diffraction
Oral presentation2007, 3rd International Workshop on New Group IV Semiconductor NanoelectronicsPublication pMOS transistor with embedded SiGe: elastic and plastic relaxation issues
Meeting abstract2007, 5th International Conference on Silicon Epitaxy and Heterostructures - ICSI-5, 20/05/2007, p.145-146Publication pMOS transistor with embedded SiGe: elastic and plastic relaxation issues
Journal article2008, Thin Solid Films, (517) 1, p.113-116