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Browsing by Author "Horsfall, A. B."

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    Analysis of the performance of a micromechanical test structure to measure stress in thick electroplated metal films

    Smith, S.
    ;
    Brockie, N. L.
    ;
    Murray, J.
    ;
    Wilson, Chris  
    ;
    Horsfall, A. B.
    ;
    Terry, J. G.
    ;
    Stevenson, J. T. M.
    Proceedings paper
    2010, IEEE International Conference on Microelectronic Test Structures - ICMTS, 23/03/2010, p.80-85
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    Fabrication of test structures to monitor stress in SU-8 films used for MEMS applications

    Smith, S.
    ;
    Brockie, N. L.
    ;
    Murray, J.
    ;
    Wilson, Chris  
    ;
    Horsfall, A. B.
    ;
    Terry, J. G.
    ;
    Stevenson, J. T. M.
    Proceedings paper
    2010, IEEE International Conference on Microelectronic Test Structures - ICMTS, 22/03/2010, p.8-13

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