Browsing by Author "Huard, V."
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Publication A new method for quickly evaluating reversible and permanent components of the BTI degradation
;Garros, X. ;Subirats, Alexandre ;Reimbold, G. ;Gaillard, F. ;Diouf, C. ;Federspiel, X.Huard, V.Proceedings paper2018, 2018 IEEE International Reliability Physics Symposium - IRPS, 11/03/2018, p.P-RT.6