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Browsing by Author "Huard, V."

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    A new method for quickly evaluating reversible and permanent components of the BTI degradation

    Garros, X.
    ;
    Subirats, Alexandre
    ;
    Reimbold, G.
    ;
    Gaillard, F.
    ;
    Diouf, C.
    ;
    Federspiel, X.
    ;
    Huard, V.
    Proceedings paper
    2018, 2018 IEEE International Reliability Physics Symposium - IRPS, 11/03/2018, p.P-RT.6

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