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Browsing by Author "Hui, W."

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    The thickness and temperature dependent resistivity of thin copper films

    Zhang, Wenqi
    ;
    Brongersma, Sywert  
    ;
    Clarysse, Trudo
    ;
    Wu, Wen
    ;
    Vervoort, Iwan
    ;
    Palmans, Roger
    Oral presentation
    2003, Advanced Metallization Conference - AMC
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    Publication

    Thickness and temperature dependent resistivity of thin copper films

    Zhang, Wenqi
    ;
    Brongersma, Sywert  
    ;
    Clarysse, Trudo
    ;
    Wu, Wen
    ;
    Vervoort, Iwan
    ;
    Palmans, Roger
    Proceedings paper
    2004, Advanced Metallization Conference 2003, 21/10/2003, p.219-224

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