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Browsing by Author "Hytch, M.J."

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    Strain measurements in transistors by dark-field holography

    Hue, Florent
    ;
    Houdellier, F.
    ;
    Bender, Hugo  
    ;
    Snoeck, E.
    ;
    Hytch, M.J.
    Oral presentation
    2009, Microscopy of Semiconducting Materials MSM XVI

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