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Browsing by Author "Ignat, M."

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    Analysis of local mechanical stresses in and near tungsten lines on silicon substrates

    De Wolf, Ingrid  
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    Ignat, M.
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    Pozza, G.
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    Maniguet, L.
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    Maes, Herman
    Journal article
    1999, J. Appl. Phys., (85) 9, p.6477-6485
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    Damage evolution and mechanical failure in flip-chip interconnects

    Soper, A.
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    De Wolf, Ingrid  
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    Pozza, G.
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    Ignat, M.
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    Parat, G.
    Proceedings paper
    1998, Electronic Packaging and Materials Science X, 14/04/1998, p.105-110
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    Experimental and analytical evaluation of stress fields fenerated by solder bump interconnections

    De Wolf, Ingrid  
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    Soper, A.
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    Pozza, G.
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    Ignat, M.
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    Parat, G.
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    Maes, Herman
    Proceedings paper
    1997, Proceedings of the International Conference and Exhibition Micro Materials - Micro Mat, 16/04/1997, p.261-266
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    Experimental validation of mechanical stress models by micro-Raman spectroscopy

    De Wolf, Ingrid  
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    Pozzat, G.
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    Pinardi, Kuntjoro
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    Howard, Dave
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    Ignat, M.
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    Jain, Suresh
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    Maes, Herman
    Proceedings paper
    1996, Proceedings ESREF '96 - 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 8/10/1996, p.1751-1754
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    Experimental validation of mechanical stress models by micro-Raman spectroscopy

    De Wolf, Ingrid  
    ;
    Pozzat, G.
    ;
    Pinardi, Kuntjoro
    ;
    Howard, Dave
    ;
    Ignat, M.
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    Jain, Suresh
    ;
    Maes, Herman
    Journal article
    1996, Microelectronics and Reliability, 36, p.1751-1754
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    Finite element simulations of the mechanical stress in and around TiSi2 lines

    Steegen, An
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    De Wolf, Ingrid  
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    Maex, Karen  
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    Ignat, M.
    Proceedings paper
    1998, Micromechanical Structures for Materials Research, 15/04/1998, p.227-232
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    Residual stresses in tungsten lines: analysis of experimental (micro-Raman spectroscopy, XRD) and numerical results

    De Wolf, Ingrid  
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    Maes, Herman
    ;
    Moffet, J.
    ;
    Ignat, M.
    Proceedings paper
    1995, Materials Reliability in Microelectronics V, 17/04/1995, p.109-114

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