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Browsing by Author "J. Uren, Michael"

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    Publication

    The impact of Ti/Al contacts on AlGaN/GaN HEMT vertical leakage and breakdown

    Rackauskas, Ben
    ;
    J. Uren, Michael
    ;
    Stoffels, Steve  
    ;
    Zhao, Ming  
    ;
    Bakeroot, Benoit  
    Journal article
    2018, IEEE Electron Device Letters, (39) 10, p.1580-1583

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