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Browsing by Author "Jacob, M."

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    Failure rate prediction and accelerated detection of anomalous charge loss in flash memories by using an analytical transient physics-based charge loss model

    Schuler, Franz
    ;
    Tempel, Georg
    ;
    Melzner, H.
    ;
    Jacob, M.
    ;
    Hendrickx, Paul  
    ;
    Wellekens, Dirk  
    Journal article
    2002, Japanese Journal of Applied Physics. Part 1, (41) 4B, p.2650-2653

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