Browsing by Author "Jiang, J."
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Publication Creative metrology development for EUVL: Flare and out-of-band qualification
Oral presentation2011, 55th International conference on Electron, Ion and Photon Beam Technology and Nanofabrication - EIPBNPublication Model calibration and validation for pre-production EUVL
; ; ; ; ;Jiang, J.Proceedings paper2012, Extreme Ultraviolet (EUV) Lithography III, 12/02/2012, p.83221LPublication Separable models for computational lithography
;Liu, Hua-Yu ;Zhao, Q. ;Chen, J.F. ;Jiang, J. ;Socha, B. ;Van Setten, E. ;Engelen, A.Meessen, J.Proceedings paper2008, Photomask and Next-Generation Lithography Mask Technology XV, 16/04/2008, p.70280X