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Browsing by Author "Jun, Xu"

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    Reliability comparison of ISSG oxide and HTO as tunnel dielectric in 3-D–SONOS applications

    Qiao, Fengying
    ;
    Arreghini, Antonio  
    ;
    Blomme, Pieter  
    ;
    Date, Lucien  
    ;
    Van den Bosch, Geert  
    Journal article
    2013, IEEE Electron Device Letters, (34) 5, p.620-622

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