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Browsing by Author "Kaczer, B."

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    Publication

    Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures

    Michl, J.
    ;
    Grill, A.
    ;
    Claes, D.
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    Rzepa, G.
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    Kaczer, B.
    ;
    Linten, D.
    ;
    Radu, I
    ;
    Grasser, T.
    ;
    Waltl, M.
    Proceedings paper
    2020, IEEE International Reliability Physics Symposium (IRPS), APR 28-MAY 30, 2020
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    Unified Analysis of Time-Dependent Dielectric Breakdown to Extend Reliability Margins

    Vici, A.  
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    Pantisano, L.
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    Roussel, P. J.
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    Chasin, A.  
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    Franco, J.  
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    Kaczer, B.  
    ;
    Meric, I.
    ;
    Ramey, S. M.
    Journal article
    2025-10-06, IEEE TRANSACTIONS ON ELECTRON DEVICES, (72) 11, p.5780-5792

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