Browsing by Author "Kaczer, B."
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Publication Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures
;Michl, J. ;Grill, A. ;Claes, D. ;Rzepa, G. ;Kaczer, B. ;Linten, D. ;Radu, I ;Grasser, T.Waltl, M.Proceedings paper2020, IEEE International Reliability Physics Symposium (IRPS), APR 28-MAY 30, 2020Publication Unified Analysis of Time-Dependent Dielectric Breakdown to Extend Reliability Margins
; ;Pantisano, L. ;Roussel, P. J.; ; ; ;Meric, I.Ramey, S. M.Journal article2025-10-06, IEEE TRANSACTIONS ON ELECTRON DEVICES, (72) 11, p.5780-5792