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Browsing by Author "Kallstenius, Thomas"

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    A multi-bits/cell PUF using analog breakdown positions in CMOS

    Chuang, Kent  
    ;
    Bury, Erik  
    ;
    Degraeve, Robin  
    ;
    Kaczer, Ben  
    ;
    Kallstenius, Thomas
    ;
    Groeseneken, Guido  
    Proceedings paper
    2018, IEEE International Reliability Physics Symposium - IRPS, 11/03/2018, p.P-CR.2-1-P-CR.2-5

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