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Browsing by Author "Kaniava, A."

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    The impact of processing-induced defects on the electrical characteristics and the degradation of Si n+p junctions

    Simoen, Eddy  
    ;
    Vanhellemont, Jan
    ;
    Kaniava, A.
    ;
    Claeys, Cor
    Proceedings paper
    1994, Proc. Symp. on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects, 1/10/1993, p.72-81

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