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Browsing by Author "Kao, K. -H."

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    Study of Endurance Performance of SiO2 Interfacial Layer Scaling Through O Scavenging in Si Channel n-FeFET With Si:HfO2 Ferroelectric Layer

    Agarwal, A.
    ;
    Walke, Amey  
    ;
    Ronchi, Nicolo  
    ;
    Kao, K. -H.
    ;
    Van Houdt, Jan  
    Journal article
    2024, IEEE TRANSACTIONS ON ELECTRON DEVICES, (71) 8, p.4619-4625

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