Browsing by Author "Karp, James"
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Publication Challenges for I/O towards the 3-nm node: Si/SiGe superlatttice I/O finFET in a horizontal nanowire technology and the increased ausceptibility of bulk finFET technology to single event latchup
Proceedings paper2018, Taiwan ESD and Reliability Conference, 7/09/2018Publication HBM and CDM ESD Performance of Advanced Silicon Photonic Components
Proceedings paper2021-10-27, 43rd Annual EOS/ESD Symposium (EOS/ESD), SEP 26-OCT 01, 2021Publication Single event latch-up: increased sensitivity from planar to FinFET
Proceedings paper2017, IEEE Nuclear & Space Radiation Effects Conference - NSREC, 17/07/2017Publication Single event latch-up: increased sensitivity from planar to FinFET
Journal article2018, IEEE Transactions on Nuclear Science, (65) 1, p.217-222