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Browsing by Author "Kauffmann, S."

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    Publication

    Improved and accurate physics-of-failure (PoF) nethodology for qualification and lifetime assessment of electronic systems

    Temsamani, A.B.
    ;
    Kauffmann, S.
    ;
    Descas, Y.
    ;
    Vandevelde, Bart  
    ;
    Zanon, Franco
    ;
    Willems, Geert  
    Journal article
    2017, Microelectronics Reliability, 76-77, p.42-46

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