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Browsing by Author "Kim, Daehong"

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    Insertion loss and polarization-dependent loss measurement improvement to enable parallel silicon photonics wafer-level testing

    Kim, Daehong
    ;
    De Coster, Jeroen  
    ;
    Van Campenhout, Joris  
    ;
    Ban, Yoojin  
    ;
    Velenis, Dimitrios  
    Journal article
    2025-MAR, OPTICS AND LASERS IN ENGINEERING, (186) March, p.108742

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