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Browsing by Author "Kirscht, F. G."

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    Recombination activity of oxygen precipitation related defects in Si

    Seifert, W.
    ;
    Kittler, M.
    ;
    Vanhellemont, Jan
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Kirscht, F. G.
    Proceedings paper
    1996, Defect Recognition and Image Processing in Semiconductors - DRIP. Proceedings of the 6th International Conference, 3/12/1995, p.319-324

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