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Browsing by Author "Kittler, M."

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    Assessing the performance of two-dimensional dopant profiling techniques

    Duhayon, Natasja  
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    Eyben, Pierre  
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    Fouchier, Marc
    ;
    Clarysse, Trudo
    ;
    Vandervorst, Wilfried  
    Journal article
    2004, Journal of Vacuum Science and Technology, (22) 1, p.385-393
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    EBIC study of recombination activity of oxygen precipitation related defects in Si

    Seifert, W.
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    Kittler, M.
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    Vanhellemont, Jan
    Journal article
    1996, Materials Science and Engineering B: Solid State Materials for Advanced Technology, (42) 1_3, p.260-4
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    Electrical properties of SiGe epitaxial layers for photovoltaic application as studied by scanning electron microscopical methods

    Kruger, O.
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    Seifert, W.
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    Kittler, M.
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    Gutjahr, A.
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    Konuma, M.
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    Said, Khalid
    ;
    Poortmans, Jef  
    Proceedings paper
    1998, Beam Injection Assessment of Defects in Semiconductors - BIADS. Proceeding of the 5th International Workshop, 30/08/1998, p.509-518
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    Electrical properties of SiGe layers grown by LPE and CVD

    Kruger, O.
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    Seifert, W.
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    Kittler, M.
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    Gutjahr, A.
    ;
    Silier, I.
    ;
    Konuma, M.
    ;
    Said, Khalid
    ;
    Caymax, Matty  
    Proceedings paper
    1998, Proceedings of the 10th Conference on Semiconducting and Insluating Materials - SIMC-X, 1/06/1998, p.185-189
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    High quality, relaxed Si1-xGex epitaxial layers for solar cell application

    Said, Khalid
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    Poortmans, Jef  
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    Caymax, Matty  
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    Loo, Roger  
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    Daami, A.
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    Bremond, G.
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    Kruger, O.
    Oral presentation
    1998, E-MRS 1998 Spring Meeting; 16-19 June 1998; Strasbourg, France.
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    High quality, relaxed SiGe epitaxial layers for solar cell application

    Said, Khalid
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    Poortmans, Jef  
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    Caymax, Matty  
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    Loo, Roger  
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    Daami, A.
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    Bremond, G.
    ;
    Kruger, O.
    Journal article
    1999, Thin Solid Films, (337) 1_2, p.85-89
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    Low-temperature passivation for SiGe-alloy solar cells

    Said, Khalid
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    Poortmans, Jef  
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    Libezny, Milan
    ;
    Caymax, Matty  
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    Nijs, Johan
    ;
    Mertens, Robert  
    Proceedings paper
    1997, 14th European Photovoltaic Solar Energy Conference and Exhibition. Proceedings of the International Conference, 30/06/1997, p.986-991
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    Recombination activity of oxygen precipitation related defects in Si

    Seifert, W.
    ;
    Kittler, M.
    ;
    Vanhellemont, Jan
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Kirscht, F. G.
    Proceedings paper
    1996, Defect Recognition and Image Processing in Semiconductors - DRIP. Proceedings of the 6th International Conference, 3/12/1995, p.319-324
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    SiGe epitaxial layers for thin-film solar cells

    Kruger, O.
    ;
    Kittler, M.
    ;
    Gutjahr, A.
    ;
    Konuma, M.
    ;
    Debarge, L.
    ;
    Slaoui, A.
    ;
    Said, Khalid
    Oral presentation
    1998, 12th International Conference on Photovoltaic Conversion and Storage of Solar Energy; 9-14 August 1998; Berlin, Germany.
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    SiGe thin-film structures for solar cells

    Brémond, G.
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    Daami, A.
    ;
    Laugier, A.
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    Seifert, W.
    ;
    Kittler, M.
    ;
    Poortmans, Jef  
    ;
    Caymax, Matty  
    Proceedings paper
    1998, Thin-Film Structures for Photovoltaics, 2/12/1997, p.43-48

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