Browsing by Author "Knowlton, William B."

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Cryogenic to room temperature effects of NBTI in high-k PMOS devices

Southwick III, Richard G.
;
Purnell, Shem T.
;
Rapp, Blake A.
;
Thompson, Ryan J.
;
Pugmire, Shane K.
Proceedings paper
2011, IEEE International Integrated Reliability Workshop - IIRW, 16/10/2011
On the thermal activation of negative bias temperature instability

Southwick, Richard G.
;
Knowlton, William B.
;
Kaczer, Ben
;
Grasser, Tibor
Proceedings paper
2009, IEEE Integrated Reliability Workshop - IIRW, 18/10/2009