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Browsing by Author "Kogel, M."

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    Investigating stress measurement capabilities using GHz scanning acoustic microscopy for 3D failure analysis

    Khaled, Ahmad  
    ;
    Brand, Sebastian
    ;
    Kogel, M.
    ;
    Appenroth, T.
    ;
    De Wolf, Ingrid  
    Journal article
    2016, Microelectronics Reliability, 64, p.336-340

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