Browsing by Author "Kohlstedt, H."
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Publication Dielectric breakdown of lithographically patterned tunnel junctions prepared by UV oxidation method
Journal article2000, Journal of Magnetism and Magnetic Materials, (222) 1_2, p.133-137Publication Statistical model for prebreakdown current jumps and breakdown caused by single traps in magnetic tunnel junctions
Journal article2003, J. Applied Physics, (94) 4, p.2749-2751