Browsing by Author "Konashuk, A.S."
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Publication Application of soft X-ray reflectometry for analysis of underlayer influence on structure of atomic-layer deposited SrTixOy films
;Filatova, E.O. ;Kozhevnikov, I.V. ;Sokolov, A.A. ;Konashuk, A.S.Schaefers, F.Journal article2014, Journal of Electron Spectroscopy and Related Phenomena, 196, p.110-116