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Browsing by Author "Kondo, S."

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    Impact of an etched EUV mask black border on imaging and overlay

    Davydova, N.
    ;
    de kruif, R.
    ;
    Fukugami, N.
    ;
    Kondo, S.
    ;
    Philipsen, Vicky  
    ;
    Van Setten, E.
    ;
    Connolly, B.
    Proceedings paper
    2012, Photomask Technology, 10/09/2012, p.852206
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    Investigation of barrier and slurry effects on the galvanic corrosion of copper

    Ernur, Didem  
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    Kondo, S.
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    Shamiryan, Denis
    ;
    Maex, Karen  
    Journal article
    2002, Microelectronic Engineering, (64) 1_4, p.117-124
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    Narrow trench corrosion of copper damascene interconnects

    Ernur, Didem  
    ;
    Kondo, S.
    ;
    Maex, Karen  
    Journal article
    2002, Japanese Journal of Applied Physics. Part 1, (41) 12, p.7338-7344

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