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Browsing by Author "Kong, J."

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    Reversible dielectric breakdown in h-BN stacks: a statistical study of the switching voltages

    Roldan, J. B.
    ;
    Maldonado, D.
    ;
    Jimenez-Molinos, F.
    ;
    Acal, C.
    ;
    Ruiz-Castro, J. E.
    ;
    Aguilera, A. M.
    Proceedings paper
    2020, IEEE International Reliability Physics Symposium (IRPS), APR 28-MAY 30, 2020

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