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Browsing by Author "Kraitchinski, A."

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    Deep levels in high-temperature 1 MeV electron irradiated n-type czochralski silicon

    Simoen, Eddy  
    ;
    Rafi, Joan Marc
    ;
    Claeys, Cor
    ;
    Neimash, V.
    ;
    Kraitchinski, A.
    ;
    Kras'ko, M.
    ;
    Tischenko, V.
    Journal article
    2003, Japanese Journal of Applied Physics. Part 1: Regular Papers, (42) 3, p.7184-7188
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    Electrically active defects in irradiated n-Type Czochralski silicon doped with group IV impurities

    David, M.L.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Neimash, V.
    ;
    Kras'ko, M.
    ;
    Kraitchinski, A.
    ;
    Voytovych, V.
    Oral presentation
    2004, Workshop on Defects Relevant to Engineering Advanced Silicon-Based Devices

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