Browsing by Author "Kudo, T."

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Degradation and recovery of Si1-xGex devices by irradiation

Ohyama, Hidenori
;
Vanhellemont, Jan
;
Takami, Y.
;
Hayama, Kiyoteru
;
Kudo, T.
;
Hakata, T.
Proceedings paper
1995, Strained Layer Epitaxy - Materials, Processing and Device Applications, 17/04/1995, p.365-371
Irradiation induced lattice defects in Si1-xGex epitaxial devices

Ohyama, Hidenori
;
Vanhellemont, Jan
;
Takami, Y.
;
Hayama, Kiyoteru
;
Kudo, T.
;
Hakata, T.
Proceedings paper
1995, ICDS-18. Proceedings 18th International Conference on Defects in Semiconductors, 23/07/1995, p.371-376