Browsing by Author "Kuo, Ying-Chun"

Dynamic ON-State Breakdown of GaN-on-Si HEMT

Hole Generation Triggered Dynamic Drain Induced Barrier Lowering of RF GaN MIS-HEMTs

Modeling of hole generation process in AlGaN/GaN HEMTs

Perspectives on GaN MISHEMT Power Amplifier versus Positive Gate Bias Instability

Physical Insights into High Current Collapse under ON-state Stress in RF GaN HEMTs

Semi-On State Hole Generation in GaN HEMTs: Experimental Evidence and TCAD Modeling

Threshold Voltage Bias Temperature Instability of RF MIS-HEMTs and Schottky HEMTs Under Semi-On State Stress

Understanding Gate Breakdown Mechanisms in RF GaN MIS-HEMTs with thin gate SiN