Browsing by Author "Kuo, Ying-Chun"
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Publication Perspectives on GaN MISHEMT Power Amplifier versus Positive Gate Bias Instability
Proceedings paper2025, IEEE International Reliability Physics Symposium (IRPS), 2025-03-30Publication Physical Insights into High Current Collapse under ON-state Stress in RF GaN HEMTs
; ; ; ; ; Jang, E-SanProceedings paper2025, IEEE International Reliability Physics Symposium (IRPS), 2025-03-30