Browsing by Author "Kuo, Ying-Chun"

Perspectives on GaN MISHEMT Power Amplifier versus Positive Gate Bias Instability

Physical Insights into High Current Collapse under ON-state Stress in RF GaN HEMTs

Threshold Voltage Bias Temperature Instability of RF MIS-HEMTs and Schottky HEMTs Under Semi-On State Stress