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Browsing by Author "Laflère, W. H."

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    An XPS study of the effects of semiconductor processing treatments used to make InP optoelectronic devices

    Van Meirhaeghe, R. L.
    ;
    Goubert, L.
    ;
    Fiermans, L.
    ;
    Laflère, W. H.
    ;
    Cardon, F.
    ;
    De Dobbelaere, Peter
    Proceedings paper
    1995, Microscopy of Semiconducting Materials 1995, 20/03/1995, p.641-644

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