Browsing by Author "Laflère, W. H."
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Publication An XPS study of the effects of semiconductor processing treatments used to make InP optoelectronic devices
;Van Meirhaeghe, R. L. ;Goubert, L. ;Fiermans, L. ;Laflère, W. H. ;Cardon, F.De Dobbelaere, PeterProceedings paper1995, Microscopy of Semiconducting Materials 1995, 20/03/1995, p.641-644