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Browsing by Author "Lalande, F."

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    Origin and repartition of the oxide fixed charges generated by electrical stress in memory tunnel oxide

    Bernardini, S.
    ;
    Masson, P.
    ;
    Houssa, Michel  
    ;
    Lalande, F.
    Journal article
    2004, Applied Physics Letters, (84) 21, p.4251-4253

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