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Browsing by Author "Lalor, M.J."

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    Effects of detrapping on electron traps generated in gate oxides

    Zhang, W.D.
    ;
    Zhang, J.F.
    ;
    Lalor, M.J.
    ;
    Burton, D.R.
    ;
    Groeseneken, Guido  
    ;
    Degraeve, Robin  
    Journal article
    2003, Semiconductor Science and Technology, (18) 2, p.174-182

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