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Browsing by Author "Lambrinou, Konstantza"

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    A novel mechanism of embrittlement affecting the impact reliability of tin-based lead-free solder joints

    Lambrinou, Konstantza
    ;
    Maurissen, Wout
    ;
    Limaye, Paresh
    ;
    Vandevelde, Bart  
    ;
    Verlinden, Bert
    Journal article
    2009, Journal of Electronic Materials, (38) 9, p.1881-1895
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    Factors affecting the bulk embrittlement of Pb-free solders

    Lambrinou, Konstantza
    Book chapter
    2011
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    Formation of a metastable celsian-cordierite eutectic structure during the crystallization of a Ba-osumilite glass-ceramic

    Lambrinou, Konstantza
    ;
    Vleugels, Jozef
    ;
    Boccaccini, Aldo R.
    Journal article
    2007, Journal of the American Ceramic Society, (90) 2, p.590-597
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    Low-temperature enbrittlement of lead-free solders in joint level impact testing

    Limaye, Paresh
    ;
    Maurissen, Wout
    ;
    Lambrinou, Konstantza
    ;
    Duflos, Frederic
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    Vandevelde, Bart  
    Proceedings paper
    2007-12, 9th Electronics Packaging Conference - EPTC, 10/12/2007, p.140-151
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    Resonant-based identification of the elastic properties of the layered materials: Application to air-plasma sprayed thermal barrier coatings

    Lauwagie, Tom
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    Lambrinou, Konstantza
    ;
    Patsias, Sophoclis
    ;
    Heylen, Ward
    ;
    Vleugels, Jozef
    Journal article
    2008, NDT & E International, 41, p.88-97
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    Resonant-based identification of the Poisson's ratio of orthotropic materials

    Lauwagie, Tom
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    Lambrinou, Konstantza
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    Sol, Hugo
    ;
    Heylen, Ward
    Journal article
    2010, Experimental Mechanics, (50) 4, p.437-447
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    Study of the mechanism of bulk embrittlement of Sn-based Pb-free solders

    Lambrinou, Konstantza
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    Vandevelde, Bart  
    ;
    Verlinden, Bert
    Proceedings paper
    2008, European Electronics Assembly Reliability Summit, 22/10/2008
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    The microstructural aspect of the ductile-to-brittle transition of Tin-based lead-free solders

    Lambrinou, Konstantza
    ;
    Engelmaier, Werner
    Journal article
    2010, Journal of ASTM International, (7) 7, p.JAI103064
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    Towards the understanding of resistive contrast imaging in in situ dielectric breakdown studies using a nanoprober setup

    Lambrinou, Konstantza
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    Hantschel, Thomas  
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    Arstila, Kai
    ;
    Kleindiek, Stephan
    ;
    Rummel, Andreas
    Proceedings paper
    2010, Advanced Interconnects and Chemical Mechanical Planarization for Micro- and Nanoelectronics, 5/04/2010, p.1249-F08-14

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