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Browsing by Author "Lee, Byoung Hun"

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    Process dependent N/PBTI characteristics of TiN gate FinFETs

    Kim, Jin Ju
    ;
    Cho, Moon Ju
    ;
    Pantisano, Luigi
    ;
    Chiarella, Thomas  
    ;
    Togo, Mitsuhiro
    ;
    Horiguchi, Naoto  
    Journal article
    2012, IEEE Electron Device Letters, (33) 7, p.937-939

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