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Browsing by Author "Lee, Younggon"

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    Publication

    A sensitivity map-based approach to profile defects in MIM capacitors from I-V, C-V and G-V measurements

    Padovani, Andrea
    ;
    Kaczer, Ben  
    ;
    Pesic, Milan
    ;
    Belmonte, Attilio  
    ;
    Popovici, Mihaela Ioana  
    Journal article
    2019, IEEE Transactions on Electron Devices, (66) 4, p.1892-1998

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