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Browsing by Author "Li, Ziqhiang"

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    RTN-based defect tracking technique: experimentally probing the spatial and energy profile of the critical filament region and its correlation with HfO2 RRAM switching operation and failure mechanism

    Chai, Zheng
    ;
    Ma, Jigang
    ;
    Zhang, Weidong
    ;
    Govoreanu, Bogdan  
    ;
    Simoen, Eddy  
    ;
    Zhang, Jiang
    Proceedings paper
    2016, IEEE Symposium on VLSI Technology, 13/06/2016, p.122-123

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