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Browsing by Author "Lin, Ji-Yung"

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    Fast & Accurate Methodology for Aging Incorporation in Circuits using Adaptive Waveform Splitting (AWS)

    Mishra, Subrat  
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    Weckx, Pieter  
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    Lin, Ji-Yung
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    Kaczer, Ben  
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    Linten, Dimitri  
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    Spessot, Alessio  
    Proceedings paper
    2020, IEEE International Reliability Physics Symposium (IRPS), APR 28-MAY 30, 2020
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    Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level

    Ranjbar, Behnaz
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    Klemme, Florian
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    Genssler, Paul R.
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    Amrouch, Hussam
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    Jung, Jinhyo
    ;
    Dave, Shail
    Proceedings paper
    2023, Design, Automation and Test in Europe Conference and Exhibition (DATE), APR 17-19, 2023
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    Multitimescale Mitigation for Performance Variability Improvement in Time-Critical Systems

    Lin, Ji-Yung  
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    Weckx, Pieter  
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    Mishra, Subrat  
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    Spessot, Alessio  
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    Catthoor, Francky  
    Journal article
    2022, IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, (30) 11, p.1757-1769
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    Proactive Run-Time Mitigation for Time-Critical Applications Using Dynamic Scenario Methodology

    Lin, Ji-Yung  
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    Weckx, Pieter  
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    Mishra, Subrat  
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    Spessot, Alessio  
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    Catthoor, Francky  
    Proceedings paper
    2022, 25th Design, Automation and Test in Europe Conference and Exhibition (DATE), MAR 14-23, 2022, p.616-619

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