Browsing by Author "Lin, Ji-Yung"
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Publication Fast & Accurate Methodology for Aging Incorporation in Circuits using Adaptive Waveform Splitting (AWS)
Proceedings paper2020, IEEE International Reliability Physics Symposium (IRPS), APR 28-MAY 30, 2020Publication Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level
;Ranjbar, Behnaz ;Klemme, Florian ;Genssler, Paul R. ;Amrouch, Hussam ;Jung, JinhyoDave, ShailProceedings paper2023, Design, Automation and Test in Europe Conference and Exhibition (DATE), APR 17-19, 2023Publication Multitimescale Mitigation for Performance Variability Improvement in Time-Critical Systems
Journal article2022, IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, (30) 11, p.1757-1769Publication Proactive Run-Time Mitigation for Time-Critical Applications Using Dynamic Scenario Methodology
Proceedings paper2022, 25th Design, Automation and Test in Europe Conference and Exhibition (DATE), MAR 14-23, 2022, p.616-619