Browsing by Author "Lin, Wei-Tung"

Hole Generation Triggered Dynamic Drain Induced Barrier Lowering of RF GaN MIS-HEMTs

Threshold Voltage Bias Temperature Instability of RF MIS-HEMTs and Schottky HEMTs Under Semi-On State Stress

Toward Understanding Stability of RF MIS-HEMTs under ON/SEMI-ON/OFF-State Pulses with Scaling in-situ SiN Thicknesses

Understanding Gate Breakdown Mechanisms in RF GaN MIS-HEMTs with thin gate SiN