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Browsing by Author "Ling, Zhi Ming"

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    Effect of CMP slurry filtration on wafer defectivity

    Devriendt, Katia  
    ;
    Meuris, Marc  
    ;
    Heylen, Nancy  
    ;
    Vrancken, Evi  
    ;
    Grillaert, Joost
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    Heyns, Marc  
    Oral presentation
    1998, MRS Spring Meeting 1998. Symposium Q: Materials Issues in Chemical-Mechanical Polishing; April 15-16, 1998; San Francisco, Calif
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    Porous structures and short-wavelength photoluminescence of C+-implanted SiO2 films

    Zhao, J.
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    Mao, D. S.
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    Ding, Xiaobin
    ;
    Ling, Zhi Ming
    ;
    Jiang, B. Y.
    ;
    Yu, Y. H.
    ;
    Yang, G. Q.
    ;
    Liu, X. H.
    Journal article
    1999, Chinese Physics Letters, (16) 5, p.361-363
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    Relation between oxide-CMP induced defects and post-CMP cleaning strategies

    Devriendt, Katia  
    ;
    Vrancken, Evi  
    ;
    Heylen, Nancy  
    ;
    Grillaert, Joost
    ;
    Meuris, Marc  
    ;
    Heyns, Marc  
    Proceedings paper
    1999, Ultra Clean Processing of Silicon Surfaces; Proceedings of the 4th International Symposium on Ultra Clean Processing of Silicon, 21/09/1998, p.173-176
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    Relation between oxide-CMP induced defects and post-CMP cleaning strategies

    Devriendt, Katia  
    ;
    Vrancken, Evi  
    ;
    Heylen, Nancy  
    ;
    Grillaert, Joost
    ;
    Meuris, Marc  
    ;
    Heyns, Marc  
    Oral presentation
    1998, 4th International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS

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