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Browsing by Author "Lokasani, Ragava"

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    Assessment of challenges in EUV resist outgassing and contamination characterization

    Pollentier, Ivan  
    ;
    Lokasani, Ragava
    ;
    Gronheid, Roel  
    Journal article
    2012, Journal of Photopolymer Science and Technology, (25) 5, p.609-616
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    EUV outgassing and contamination in multilayer material schemes

    Pollentier, Ivan  
    ;
    Truffert, Vincent  
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    Lokasani, Ragava
    ;
    Gronheid, Roel  
    Proceedings paper
    2011, International Symposium on Extreme Ultraviolet Lithography - EUVL, 17/10/2011
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    Imec update on resist outgassing qualification

    Pollentier, Ivan  
    ;
    Lokasani, Ragava
    ;
    Gronheid, Roel  
    Oral presentation
    2012, IEUVI Resist TWG Meeting
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    Outgassing studies on EUV underlayers containing PAGs

    Guerrero, Douglas  
    ;
    Ouattara, Tantiboro
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    Pollentier, Ivan  
    ;
    Lokasani, Ragava
    Proceedings paper
    2011, International Symposium on Extreme Ultraviolet Lithography - EUVL, 17/10/2011
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    Progress in understanding EUV resist related outgassing and contamination

    Pollentier, Ivan  
    ;
    Lokasani, Ragava
    ;
    Gronheid, Roel  
    Oral presentation
    2012, International Symposium on Extreme Ultraviolet Lithography - EUVL
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    Relationship between resist outgassing and witness sample contamination in NXE outgas qualification using electrons and EUV

    Pollentier, Ivan  
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    Lokasani, Ragava
    ;
    Gronheid, Roel  
    ;
    Hill, S.
    ;
    Tarrio, C.
    ;
    Lucatorto, T.
    Proceedings paper
    2013, Extreme Ultraviolet (EUV) Lithography IV, 24/02/2013, p.86790K
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    Update on resist outgassing qualification towards NXE3100

    Pollentier, Ivan  
    ;
    Lokasani, Ragava
    ;
    Gronheid, Roel  
    Oral presentation
    2012, IEUVI Resist TWG

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