Browsing by Author "Luo, Weichun"
Now showing 1 - 1 of 1
- Results Per Page
- Sort Options
Publication Impact of ALD TiN capping layer on interface trap and channel hot carrier reliability of HKMG nMOSFETs
;Yang, Hong ;Luo, Weichun ;Zhou, Longda; ;Tang, Bo; ;Yin, HuaxiangZhu, HuilongJournal article2018, IEEE Electron Device Letters, (39) 8, p.1129-1132