Repository logo Institutional repository
  • Communities & Collections
  • Browse
  • Site
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Luo, Weichun"

Filter results by typing the first few letters
Now showing 1 - 1 of 1
  • Results Per Page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    Impact of ALD TiN capping layer on interface trap and channel hot carrier reliability of HKMG nMOSFETs

    Yang, Hong
    ;
    Luo, Weichun
    ;
    Zhou, Longda
    ;
    Xu, Hao  
    ;
    Tang, Bo
    ;
    Simoen, Eddy  
    ;
    Yin, Huaxiang
    ;
    Zhu, Huilong
    Journal article
    2018, IEEE Electron Device Letters, (39) 8, p.1129-1132

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings