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Browsing by Author "Luyken, R.J."

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    High resolution 2D scanning spreading resistance microscopy (SSRM) of thin film SOI MOSFETs with ultra short effective channel length

    Hartwich, J.
    ;
    Alvarez, David
    ;
    Dreeskornfeld, L.
    ;
    Hoffman, F.
    ;
    Kretz, J.
    ;
    Landgraf, E.
    ;
    Luyken, R.J.
    Proceedings paper
    2003, IEEE International SOI Conference, 29/09/2003, p.35-36

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