Browsing by Author "Magnusson, Ulf"
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Publication Low-frequency noise and DC characterization of ionization damage in a 1-µm SOI CMOS technology adapted for space applications
; ; Publication Mrad(Si) irradiation effects in gate-all-around silicon-on-insulator n-MOSFET's
Proceedings paper1994, Proceedings of the 6th International Symposium on Silicon-on-Insulator Technology and Devices, 22/05/1994, p.375-380Publication The kink-related excess low-frequency noise in silicon-on-insulator MOST's
Journal article1994, IEEE Transactions on Electron Devices, (41) 3, p.330-339Publication Transient effects in accumulation mode p-channel SOI MOSFETs operating at 77K
Journal article1994, IEEE Transactions on Electron Devices, (41) 4, p.519-523