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Browsing by Author "Mahmood, Salman"

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    Impact of gate oxide breakdown of varying hardness on narrow and wide nFETs

    Kaczer, Ben  
    ;
    Degraeve, Robin  
    ;
    De Keersgieter, An  
    ;
    Mahmood, Salman
    ;
    Groeseneken, Guido  
    Proceedings paper
    2004-04, Proceedings IEEE International Reliability Physics Symposium - IRPS, 25/04/2004, p.79-83

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