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Browsing by Author "Masson, P."

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    Effect of fixed dielectric charges on tunnelling transparency in MIM and MIS structures

    Bernardini, S.
    ;
    Masson, P.
    ;
    Houssa, Michel  
    Journal article
    2004, Microelectronic Engineering, (72) 1_4, p.90-95
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    Origin and repartition of the oxide fixed charges generated by electrical stress in memory tunnel oxide

    Bernardini, S.
    ;
    Masson, P.
    ;
    Houssa, Michel  
    ;
    Lalande, F.
    Journal article
    2004, Applied Physics Letters, (84) 21, p.4251-4253

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