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Browsing by Author "Mc Curdy, M.W."

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    Efficient reliability testing of emerging memory technologies using multiple radiation sources

    Bennet, W.G.
    ;
    Hooten, N.C.
    ;
    Weeded-Wright, S.
    ;
    Schrimpf, R.D.
    ;
    Reed, R.A.
    ;
    Alles, M.C.
    ;
    Zhang, E.X.
    Proceedings paper
    2014, 23rd Conference on Application of Accelerators in Research and Industry - CAARI, 25/05/2014, p.1-8

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