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    Hot electron degradation of the DC and microwave performance of InAlAs/InGaAs/InP HEMTs

    Menozzi, R
    ;
    Borgarino, M.
    ;
    Baeyens, Yves
    ;
    Van Hove, Marleen
    ;
    Fantini, F.
    Proceedings paper
    1996, Proceedings of the 26th European Solid-State Device Research Conference - ESSDERC, 9/09/1996, p.1009-1012

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