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    Analysis of NBTI effects on high frequency digital circuits

    Unutulmaz, Ahmet
    ;
    Helms, Domenik
    ;
    Eilers, Reef
    ;
    Metzdorf, Malte
    ;
    Kaczer, Ben  
    ;
    Nebel, Wolfgang
    Proceedings paper
    2016, Design, Automation & Test in Europe Conference & Exhibition - DATE, 14/03/2016, p.223-228

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