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Browsing by Author "Minucci, F."

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    Impact of Si-thickness on interface and device properties for Si-passivated Ge pMOSFETs

    Martens, Koen  
    ;
    Mitard, Jerome  
    ;
    De Jaeger, Brice  
    ;
    Meuris, Marc  
    ;
    Maes, Herman
    ;
    Groeseneken, Guido  
    Proceedings paper
    2008, 38th European Solid-State Device Research Conference - ESSDERC, 15/09/2008, p.138-141

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